Imaging

Whether your imaging needs are on the micro or nano scale, we have solutions for you.

Imaging with a Digital Microscope, Scanning Electron Microscope (SEM), Atomic Force Microscope (AFM), and Transmission Electron Microscope (TEM) are all available.

Chemical Analysis

Finding out more about the elements present in your sample is key to understanding your parts.

Map out elemental distribution on the micro scale with EDS in the SEM, or on the nano scale with EDS mapping on a TEM image.

For more detailed surface chemistry, XPS is also available.

Sample Preparation

Mechanical Cross-Sections are no problem, or we can perform smaller cuts into your sample with Focused Ion Beam (FIB) technology. FIB is our method of choice for sample preparation for TEM analysis.

Partial List of Techniques and Equipment Available for Use

Recently added capabilities:
  • FTIR
  • UV Vis
  • Dilatometer
  • XRD
  • Instron

For microscale analysis:
  • Keyence VHX5000 Digital Microscope
  • FEI Quanta 600 SEM with EDX
  • FEI Helios DualBeam FIB
  • XPS
  • AFM
  • JEOL 2800 TEM
  • ...and much more - just ask!